论文标题
用于量子设备测试的紧凑型低温探针站
A compact and versatile cryogenic probe station for quantum device testing
论文作者
论文摘要
低温电气表征测量值的快速反馈是开发可扩展量子计算技术的关键。在室温下，使用基于探针的解决方案来完成高通量设备测试，其中电探针被反复放置在设备上以获取统计数据。在这项工作中，我们提出了一个探测站，该探测站可以从室温下降到低于2 $ \，$ k。它的小尺寸使其与磁铁的标准低温测量设置兼容。可以测试各种各样的电子设备。在这里，我们通过将硅鳍片效应晶体管作为量子点旋转量子的宿主来证明了Prober的性能。这样的工具可以大大加速设计实用的测定周期，并提供重要的反馈，以优化构建可扩展量子电路的过程。
Fast feedback from cryogenic electrical characterization measurements is key for the development of scalable quantum computing technology. At room temperature, high-throughput device testing is accomplished with a probe-based solution, where electrical probes are repeatedly positioned onto devices for acquiring statistical data. In this work we present a probe station that can be operated from room temperature down to below 2$\,$K. Its small size makes it compatible with standard cryogenic measurement setups with a magnet. A large variety of electronic devices can be tested. Here, we demonstrate the performance of the prober by characterizing silicon fin field-effect transistors as a host for quantum dot spin qubits. Such a tool can massively accelerate the design-fabrication-measurement cycle and provide important feedback for process optimization towards building scalable quantum circuits.
