论文标题
检测仪式异常的检测横截面依赖性
Inspection of the detection cross section dependence of the Gallium Anomaly
论文作者
论文摘要
我们详细讨论了凝固膜对检测横截面的依赖性。我们提供了镀与异常大小的大小的更新值，并发现其意义大于所有检测横截面型号的$5σ$。我们讨论了甘同异常对$ {}^{71} \ text {ge} $的假定值的依赖性，该值确定了从$ {}^{71}^{71} \ text {ga} $的过渡状态的横截面。我们表明，$ {}^{71} \ text {ge} $的半寿命的值大于标准人可以减少甚至解决镀锌异常的寿命。考虑到镀与异常的短基线中微子振荡解释，我们表明$ {}^{71} \ text {ge} $半寿命的值大于标准寿命，它可以减少其他实验结果的张力。由于$ {}^{71} \ text {ge} $ Half Life的标准值于1985年衡量，因此我们提倡使用现代技术和设备的新测量值的重要性，以更好地评估凝胶异常。
We discuss in detail the dependence of the Gallium Anomaly on the detection cross section. We provide updated values of the size of the Gallium Anomaly and find that its significance is larger than about $5σ$ for all the detection cross section models. We discuss the dependence of the Gallium Anomaly on the assumed value of the half life of ${}^{71}\text{Ge}$, which determines the cross sections of the transitions from the ground state of ${}^{71}\text{Ga}$ to the ground state of ${}^{71}\text{Ge}$. We show that a value of the ${}^{71}\text{Ge}$ half life which is larger than the standard one can reduce or even solve the Gallium Anomaly. Considering the short-baseline neutrino oscillation interpretation of the Gallium Anomaly, we show that a value of the ${}^{71}\text{Ge}$ half life which is larger than the standard one can reduce the tension with the results of other experiments. Since the standard value of the ${}^{71}\text{Ge}$ half life was measured in 1985, we advocate the importance of new measurements with modern technique and apparatus for a better assessment of the Gallium Anomaly.
