论文标题

Sio $ _2 $和HFO $ _2 $的高功率激光光学器件的异质结构胶片由等离子体增强原子层沉积

Heterostructure films of SiO$_2$ and HfO$_2$ for high power laser optics prepared by plasma-enhanced atomic layer deposition

论文作者

Alam, Shawon, Paul, Pallabi, Beladiya, Vivek, Stenzel, Olaf, Trost, Marcus, Wilbrandt, Steffen, Schroeder, Sven, Matthaeus, Gabor, Nolte, Stefan, Riese, Sebastian, Otto, Felix, Fritz, Torsten, Gottwald, Alexander, Szeghalmi, Adriana

论文摘要

吸收损失和激光诱导的损伤阈值(LIDT)被认为是用于开发高功率激光光学涂层的主要限制。这样的涂层需要至高无上的特性,例如由于光吸收,高机械稳定性以及对承受高强度激光脉冲的损伤性增强而导致的低损失。在这项工作中,使用质量增强原子层沉积(PEALD)技术的Sio $ _2 $和HFO $ _2 $的混合来开发异质结构膜。薄膜表征技术(例如光谱椭圆测量法,分光光度法,底物曲率测量值,X射线反射率和傅立叶变换红外光谱法被用于提取光学常数,光谱间隔,残基应力,层形成,层形成和功能组,分别存在于杂质结构中。这些异质结构表现出可调的折射率,带隙和改进的光学损失和LIDT特性。将薄膜掺入抗反射涂层(多层堆栈和分级索引涂层)中,并通过R-ON-1方法在355 nm波长下确定LIDT。使用光热通用路径干涉法和激光诱导的偏转技术表征了报道波长处的光学吸收。

Absorption losses and laser-induced damage threshold (LIDT) are considered as the major constraint for the development of optical coatings for high-power laser optics. Such coatings require paramount properties like low losses due to optical absorption, high mechanical stability, and enhanced damage resistance to withstand high-intensity laser pulses. In this work, heterostructure films were developed by the intermixing of SiO$_2$ and HfO$_2$ using plasma-enhanced atomic layer deposition (PEALD) technique. Thin film characterization techniques such as spectroscopic ellipsometry, spectrophotometry, substrate curvature measurements, x-ray reflectivity, and Fourier transform infrared spectroscopy were employed for extracting optical constants, spectral inter-pretation, residual stress, layer formation, and functional groups present in the heterostructures, respectively. These heterostructures demonstrate tunable refractive index, bandgap, and improved optical losses and LIDT properties. The films were incorporated into antireflection coatings (multilayer stacks and graded index coatings) and the LIDT was determined at 355 nm wavelength by the R-on-1 method. Optical absorptions at the reported wavelengths were characterized using photothermal common-path interferometry and laser-induced deflection techniques.

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