论文标题

测量非理想P-N二极管中碳纳米管网络的电子带隙

Measuring the Electronic Bandgap of Carbon Nanotube Networks in Non-ideal p-n Diodes

论文作者

Oyibo, Gideon, Barrett, Thomas, Jois, Sharadh, Blackburn, Jeffrey L., Lee, Ji Ung

论文摘要

由于其尺寸,因此在准二维材料(例如碳纳米管)(例如碳纳米管)中的带隙的测量很具有挑战性。在这项工作中,我们使用非理想的P-N二极管测量了聚合物包裹的半导体单壁碳纳米管(S-SWCNT)网络的电子带隙。使用这些二极管,我们测量具有不同直径的不同聚合物包裹的S-SWCNT的电子带隙和激子水平:ARC放电(〜1.55nm),(7,5)(0.83nm)(0.83nm)和(6,5)和(6,5)(0.76nm)。我们的价值与理论预测一致,从而洞悉了S-SWCNT网络的基本属性。

The measurement of the bandgap in quasi-one dimensional materials such as carbon nanotubes is challenging due to its dimensionality. In this work, we measure the electronic bandgap of networks of polymer-wrapped semiconducting single-walled carbon nanotubes (s-SWCNTs) using non-ideal p-n diodes. Using these diodes, we measure the electronic bandgap and excitonic levels of different polymer-wrapped s-SWCNTs with varying diameters: arc discharge (~1.55nm), (7,5) (0.83nm), and (6,5) (0.76nm). Our values are consistent with theoretical predictions, providing insight into the fundamental properties of networks of s-SWCNTs.

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