论文标题
使用加载的圆形孔径探头，高分辨率在田间微波成像附近成像
High Resolution Near Field Microwave Imaging using Loaded Circular Aperture Probe
论文作者
论文摘要
圆形孔径探针已成功用于高分辨率近场微波成像。已经确定，与常规用于近场成像的矩形孔径探针相比，圆形孔径探针可以想象可以提供更高的图像保真度。在本文中，建议通过用谐振虹膜加载圆形光圈来进一步增强近场成像的分辨率和灵敏度。本文提出的探测器在X波段频率范围内运行，并在虹膜开放时表现出非常局部的近场分布。因此，与在同一频带上运行的常规孔径探针相比，其成像分辨率和灵敏度得到了增强。使用3D电磁模拟分析所提出的探针的成像能力，并通过实验验证其性能。实际成像介电和金属样品证明了所提出的探针对高分辨率成像的功效。此外，将使用所提出的探针获得的图像与使用常规圆形和矩形孔径探针获得的图像进行比较。将证明，与常规孔径探针相比，提出的探针具有更高的灵敏度和分辨率。
Circular aperture probes have been successfully used for high-resolution near-field microwave imaging. It has been established that circular aperture probes could conceivably provide higher image fidelity compared to rectangular aperture probes used conventionally for near-field imaging. In this paper, it is proposed to further enhance the near-field imaging resolution and sensitivity by loading the circular aperture with a resonant iris. The proposed probe herein operates in the X-band frequency range and exhibits very localized near-field distribution at the opening of the iris. Consequently, its imaging resolution and sensitivity are enhanced compared to the conventional aperture probes operating over the same frequency band. The imaging capability of the proposed probe is analyzed using 3D electromagnetic simulation, and its performance is validated experimentally. The efficacy of the proposed probe for high-resolution imaging is demonstrated by practical imaging dielectric and metallic samples. Furthermore, the obtained images using the proposed probe are compared to those acquired using conventional circular and rectangular aperture probes. It will be demonstrated that the proposed probe provides higher sensitivity and resolution compared to the conventional aperture probes.
