论文标题
通过脉冲激光沉积来探索TAAS Weyl半分薄膜的生长条件
Exploration of growth conditions of TaAs Weyl semimetal thin film by pulsed laser deposition
论文作者
论文摘要
TAA是第一个实验发现的Weyl半分材料,由于其高载体迁移率,高各向异性,非磁性和与光的强烈相互作用,引起了很多关注。这些使其成为研究Weyl Fermions以及在量子计算,热电设备和光电检测中的应用的理想候选者。为了进一步的基本物理研究和潜在的应用,迫切需要大小和高质量的TAA膜。然而,由于生长过程中AS的挥发,很难种植促成化学计量的TAA膜。为了解决这个问题,尝试使用脉冲激光沉积(PLD)具有不同AS化学计量比的靶标在不同的底物上生长TAAS膜。在这项工作中,我们发现,作为GAAS底物离子的部分可能会在生长过程中扩散到TAAS膜中,这是通过结构表征,表面形貌和组成分析的初步证实的。结果,TAAS膜中的AS含量得到了改善,并实现了TAAS阶段。我们的工作提出了一种有效的方法,可以通过PLD制造TAAS膜,从而可能将Weyl Semimetal Film用于功能设备。
TaAs, the first experimentally discovered Weyl semimetal material, has attracted a lot of attention due to its high carrier mobility, high anisotropy, nonmagnetic and strong interaction with light. These make it an ideal candidate for the study of Weyl fermions and the applications in quantum computation, thermoelectric devices, and photodetection. For further basic physics studies and potential applications, large-size and high-quality TaAs films are urgently needed. However, it is difficult to grow As-stoichiometry TaAs films due to the volatilization of As during the growth. To solve this problem, the TaAs films were attempted to grow on different substrates using targets with different As stoichiometric ratios by pulsed laser deposition (PLD). In this work, we have found that partial As ions of the GaAs substrate are likely to diffuse into the TaAs films during growth, which was preliminarily confirmed by the structural characterization, surface topography and composition analysis. As a result, the As content in the TaAs film is improved and the TaAs phase is achieved. Our work presents an effective method to fabricate the TaAs films by PLD, providing the possible use of the Weyl semimetal film for functional devices.