论文标题
亚轴轴向精度深度成像，用纠缠的两彩色hong-ou-mandel显微镜检查
Sub-μm axial precision depth imaging with entangled two-colour Hong-Ou-Mandel microscopy
论文作者
论文摘要
两个波长键入光子在梁弹圈上重叠的量子干扰会导致振荡干扰模式。节拍音符的频率取决于纠缠光子的波长分离，但可以限制标准干扰法的实用性到范围的波长尺度扰动。在这里，我们使用两色纠缠干涉仪来评估半透明样品的厚度与二维栅格扫描的变化。轴向精度和显微镜的动态范围通过调节纠缠光子对的波长分离来积极控制。据报道，低于$μm$ $ $ $精度的使用最高为$ 12.3〜nm $的失调和$ \ sim10^4 $检测到的光子对。
The quantum interference of two wavelength-entangled photons overlapping at a beamsplitter results in an oscillating interference pattern. The frequency of the beat note is dependent on the wavelength separation of the entangled photons but is robust to wavelength scale perturbations that can limit the practicality of standard interferometry. Here we use two-colour entanglement interferometry to evaluate the variation in thickness of a semi-transparent sample in combination with two-dimensional raster scanning. The axial precision and the dynamic range of the microscope are actively controlled by adjusting the wavelength separation of the entangled photon pairs. Sub-$μm$ precision is reported using up to $12.3~nm$ of detuning and $\sim10^4$ detected photon pairs.
