论文标题
波导集成硅T中心
Waveguide-integrated silicon T centres
论文作者
论文摘要
模块化,网络量子技术的性能将在很大程度上取决于其量子光互连的质量。固态颜色中心,尤其是硅的T中心,提供了竞争性的技术和商业优势,作为量子网络技术和分布式量子计算的基础。这些新重新发现的硅缺陷提供直接电信波段光子发射,长寿命的电子和核自旋吨位,并以尺度上的CMOS兼容,硅硅(SOI)光子芯片验证了本机积分到行业标准的cmos标准。在这里,我们通过表征SOI中单模波导中的T中心自旋集合来证明进一步的整合水平。除了测量长旋转T_1次外,我们还报告了集成中心的光学性质。我们发现,这些波导集成发射器的狭窄均匀线宽已经足够低,可以预测仅具有适度的腔purcell purcell增强功能的远程旋转旋转方案的未来成功。我们表明,通过测量同位素纯体晶体中的几乎寿命限制的均匀线宽,可能仍然可以进行进一步的改进。在每种情况下,测得的线宽都比先前报道的要高的数量级,并进一步支持以下观点:高性能,大规模的分布式量子技术基于硅的T中心可以在短期内实现。
The performance of modular, networked quantum technologies will be strongly dependent upon the quality of their quantum light-matter interconnects. Solid-state colour centres, and in particular T centres in silicon, offer competitive technological and commercial advantages as the basis for quantum networking technologies and distributed quantum computing. These newly rediscovered silicon defects offer direct telecommunications-band photonic emission, long-lived electron and nuclear spin qubits, and proven native integration into industry-standard, CMOS-compatible, silicon-on-insulator (SOI) photonic chips at scale. Here we demonstrate further levels of integration by characterizing T centre spin ensembles in single-mode waveguides in SOI. In addition to measuring long spin T_1 times, we report on the integrated centres' optical properties. We find that the narrow homogeneous linewidth of these waveguide-integrated emitters is already sufficiently low to predict the future success of remote spin-entangling protocols with only modest cavity Purcell enhancements. We show that further improvements may still be possible by measuring nearly lifetime-limited homogeneous linewidths in isotopically pure bulk crystals. In each case the measured linewidths are more than an order of magnitude lower than previously reported and further support the view that high-performance, large-scale distributed quantum technologies based upon T centres in silicon may be attainable in the near term.