论文标题
纠缠增强的磁感应断层扫描
Entanglement-enhanced magnetic induction tomography
论文作者
论文摘要
磁感应层析成像（MIT）是一种传感协议，通过对射频磁场的响应来探索导电物体。 MIT用于从地球物理学到医疗应用的无损测试。用作MIT传感器的原子磁力计，可以显着提高MIT敏感性并探索其量子限制。在这里，我们将用作传感元件的原子磁力计报告纠缠增强的MIT。我们通过频道量子量子的非隔离测量产生了传感器原子的纠缠和自旋挤压状态。然后，我们利用这种自旋状态来证明超出标准量子极限以外的一维MIT灵敏度的提高。
Magnetic induction tomography (MIT) is a sensing protocol, exploring conductive objects via their response to radio-frequency magnetic fields. MIT is used in nondestructive testing ranging from geophysics to medical applications. Atomic magnetometers, employed as MIT sensors, allow for significant improvement of the MIT sensitivity and for exploring its quantum limits. Here we report entanglement-enhanced MIT with an atomic magnetometer used as the sensing element. We generate an entangled and spin squeezed state of atoms of the sensor by stroboscopic quantum non-demolition measurement. We then utilize this spin state to demonstrate the improvement of one-dimensional MIT sensitivity beyond the standard quantum limit.
