论文标题
顺序广义测量：渐近，典型性和新兴投影测量值
Sequential generalized measurements: Asymptotics, typicality and emergent projective measurements
论文作者
论文摘要
投射测量与广义量子测量之间的关系是量子物理学的基本问题，澄清此问题对于量子技术也很重要。虽然直观地知道可以通过顺序的广义测量或弱测量来构建投影测量值，但在一般情况下仍然缺乏证据证明该假设。在这里，我们从量子通道的角度证明了这一点。我们表明，投射测量自然是由渐近极限中的顺序广泛测量产生的。具体而言，选择性投影测量来自一组典型的选择性广义测量序列。我们提供了一个明确的方案，以构建具有顺序广泛测量的量子系统的投影测量。值得注意的是，单个Ancilla Qubit足以介导顺序的广义测量，用于构建通用系统的任意投影测量。
The relation between projective measurements and generalized quantum measurements is a fundamental problem in quantum physics, and clarifying this issue is also important to quantum technologies. While it has been intuitively known that projective measurements can be constructed from sequential generalized or weak measurements, there is still lack of a proof of this hypothesis in general cases. Here we prove it from the perspective of quantum channels. We show that projective measurements naturally arise from sequential generalized measurements in the asymptotic limit. Specifically, a selective projective measurement arises from a set of typical sequences of selective generalized measurements. We provide an explicit scheme to construct projective measurements of a quantum system with sequential generalized measurements. Remarkably, a single ancilla qubit is sufficient to mediate sequential generalized measurements for constructing arbitrary projective measurements of a generic system.
