论文标题
低质量暗物质(IN)直接检测非弹性散射
Low-Mass dark matter (in)direct detection with inelastic scattering
论文作者
论文摘要
我们在直接检测实验中重新审查了发光暗物质的检测。在这种情况下,深色物质从吸热地散布以产生激发态,该态腐烂以产生光子。我们探讨了从衰减光子中的电子后坐信号可以与其他电势后坐力信号区分开的方式。我们发现,较大的体积/暴露氙气检测器将无法区分信号来源,而无需大幅改善探测器能量的分辨率围绕数量级。我们还探讨了有关具有较高分辨率检测器的通用发光暗物质信号的知识。受固态探测器在能量解决方案的进步的推动下,我们发现SUB-EV解决方案可以在存在背景级别的存在下发现LDM,否则可以使观察变得不可能。我们还发现,Sub-EV分辨率可用于确定发光暗物质衰变谱的形状,从而限制暗物质质量和速度分布。
We revisit the detection of luminous dark matter in direct detection experiments. In this scenario, dark matter scatters endothermically to produce an excited state, which decays to produce a photon. We explore ways in which the electron recoil signal from the decay photon can be differentiated from other potential electron recoil signals with a narrow spectral shape. We find that larger volume/exposure xenon detectors will be unable to differentiate the signal origin without significant improvements in detector energy resolution of around an order of magnitude. We also explore what can be learned about a generic luminous dark matter signal with a higher resolution detector. Motivated by the advancements in energy resolution by solid-state detectors, we find that sub-eV resolution enables the discovery of LDM in the presence of background levels that would otherwise make observation impossible. We also find that sub-eV resolution can be used to determine the shape of the luminous dark matter decay spectrum and thus constrain the dark matter mass and velocity distribution.