论文标题
$^{24} $ si的高精度质量测量以及$ a = 22 $等待点的$ rp $进程的精致确定
High-precision mass measurement of $^{24}$Si and a refined determination of the $rp$ process at the $A=22$ waiting point
论文作者
论文摘要
我们报告了$^{24} {\ rm si} $的高精度质量测量，该{\ rm si} $在国家超导性回旋实验室与LEBIT设施一起执行。原子质量过剩，$ 10 \; 753.8 $（37）KEV，比以前的结果更精确5倍。这大大降低了$^{23} {\ rm al}（p，γ）^{24} {\ rm si} $反应速率的不确定性，这是快速质子捕获（$ rp $）的关键部分。更新的速率以$^{22} {\ rm mg} $等待点的精度为$^{22} {\ rm mg} $以9％的精度限制$（α，p）$进程的发作温度。
We report a high precision mass measurement of $^{24}{\rm Si}$, performed with the LEBIT facility at the National Superconducting Cyclotron Laboratory. The atomic mass excess, $10\;753.8$(37) keV, is a factor of 5 more precise than previous results. This substantially reduces the uncertainty of the $^{23}{\rm Al}(p,γ)^{24}{\rm Si}$ reaction rate, which is a key part of the rapid proton capture ($rp$) process powering Type I X-ray bursts. The updated rate constrains the onset temperature of the $(α,p)$ process at the $^{22}{\rm Mg}$ waiting-point to a precision of 9%.
