论文标题
数据驱动的物联网设备故障分析的模型：初步研究
Data-Driven Model for Failure Analysis of Internet of Things Devices: A Preliminary Study
论文作者
论文摘要
本文提出了有关物联网（IoT）设备数据驱动的失败分析模型的初步研究。该模型着重于传输数据和接收数据在低功率广泛区域网络（Lorawan）中的影响。 To set up the network, the authors develop the combination of four several technology parts, including 1) the End Device Gateway Network server of LoRa IoT, 2) an Application server for storing the data in the database, 3) the Dashboard to show and got the command by the user, and 4) the failure analysis model based on Bayesian belief networks which calculate the probability values that collect the data transferring both uplink and downlink on the network connection in this study.在测试阶段，作者将分离的数据输入到数据驱动的失败分析模型中，以分析连接的时间和潜伏期，以关注整体系统故障的影响和风险。该模型将显示故障的概率值。作者希望使用结果来阐明测试的物联网设备是否适合使用。
This paper proposes the preliminary study of the data-driven failure analysis model for the internet of things (IoT) devices. This model focus on the impact of data transferring both get and receiving data in class C of Low Power Wide Area Network (LoRaWAN). To set up the network, the authors develop the combination of four several technology parts, including 1) the End Device Gateway Network server of LoRa IoT, 2) an Application server for storing the data in the database, 3) the Dashboard to show and got the command by the user, and 4) the failure analysis model based on Bayesian belief networks which calculate the probability values that collect the data transferring both uplink and downlink on the network connection in this study. In the testing phase, the authors input the separated data into the data-driven failure analysis model to analyze the time and latency of the connection by the concern of the impact and risk of the failure of the overall system. The model will show the probability value of failure. The authors hope to use the results to clarify whether a tested IoT device is suitable for use or not.
