论文标题
增强的反射率变化和极化光的相移：双参数多层传感器
Enhanced Reflectivity Change and Phase Shift of Polarized Light: Double Parameter Multilayer Sensor
论文作者
论文摘要
在此，使用低折射率和消光系数的半导体和介电的模拟证明了基于极化光相差和光吸收的黑暗点的概念，以及高折射率非氧化金属化金属多层多层薄膜结构。通过测量反射率比ψ和相移δ，几种多层传感器配置对可检测材料的厚度和折射率变化的敏感性很高。重点是此类多层，这些多层对可见光谱范围内的两个参数（ψ，δ）具有敏感性，因此为通过增强的双参数传感增强的新生物医学传感器开发提供了进一步研究的可能性。
Herein, the concept of point of darkness based on polarized light phase difference and absorption of light is demonstrated by simulations using low refractive index and extinction coefficient semiconductor and dielectric, and high refractive index nonoxidizing metal multilayer thin film structures. Several multilayer sensor configurations show great sensitivity to thickness and refractive index variation of the detectable material by measuring the reflectivity ratio Ψ and phase shift Δ. Focus is on such multilayers, which have sensitivity to both parameters (Ψ, Δ) in the visible spectral range, thus opening the possibility for further research on a new biomedical sensor development with enhanced double parameter sensing.
