论文标题
bi $ _2 $ _3 $ _3 $ nanoplate在van der waals Epatosperapy中的纳米板
Surface-bulk coupling in a Bi$_2$Te$_3$ nanoplate grown by van der Waals epitaxy
论文作者
论文摘要
我们报告了一项实验研究,该研究对三维拓扑绝缘体BI $ _2 $ _3 $ _3 $纳米板的相干表面堆积电子散射对量子传输的影响。纳米板是通过云母基板上的范德华同际生长的,并直接从纳米板上直接在生长基板上制造了顶门的霍尔杆装置。设备板电阻的顶栅电压依赖性测量结果表明,纳米板中的传输载体是N型的,并且随着顶部门电压的降低,纳米板中的载体密度降低。但是,随着顶门电压的降低,迁移率增加。这种动机性随着纳米板的载体密度降低而增加,这表明是由于散装到表面电子散射率的降低而产生的。在低温下进行低场磁转运测量。测得的纳米板磁性电导率显示出典型的弱抗本地化(WAL)特征。我们通过考虑表面散布渠道间电子散射来分析测量结果,并提取dephasing时间$ τ_ϕ $,扩散系数$ d $ $ d $在顶面和散装中,以及表面螺母散射时间$τ_{sb} $作为顶式伏特和温度的功能。发现纳米板中的脱缘物主要源于具有小能量转移的电子电子散射。还发现,随着门电压降低或温度的升高,$ τ_ϕ $/$τ_{sb} $的比率降低了。我们证明,在我们的Bi $ _2 $ _2 $ _3 $纳米板上考虑表面构成相干电子散射对于了解低温下的量子传输测量值至关重要。
We report on an experimental study of the effect of coherent surface-bulk electron scattering on quantum transport in a three-dimensional topological insulator Bi$_2$Te$_3$ nanoplate. The nanoplate is grown via van der Waals epitaxy on a mica substrate and a top-gated Hall-bar device is fabricated from the nanoplate directly on the growth substrate. Top-gate voltage dependent measurements of the sheet resistance of the device reveal that the transport carriers in the nanoplate are of n-type and that, with decreasing top gate voltage, the carrier density in the nanoplate is decreased. However, the mobility is increased with decreasing top-gate voltage. This mobility increase with decreasing carrier density in the nanoplate is demonstrated to arise from a decrease in bulk-to-surface electron scattering rate. Low-field magnetotransport measurements are performed at low temperatures. The measured magnetoconductivity of the nanoplate shows typical weak anti-localization (WAL) characteristics. We analyze the measurements by taking surface-bulk inter-channel electron scattering into account and extract dephasing times $τ_ϕ$, diffusion coefficients $D$ of electrons at the top surface and in the bulk, and the surface-bulk scattering times $τ_{SB}$ as a function of top-gate voltage and temperature. It is found that the dephasing in the nanoplate arises dominantly from electron-electron scattering with small energy transfers. It is also found that the ratio of $τ_ϕ$/$τ_{SB}$ (a measure of the surface-bulk electron coherent coupling) is decreased with decreasing gate voltage or increasing temperature. We demonstrate that taking the surface-bulk coherent electron scattering in our Bi$_2$Te$_3$ nanoplate into account is essential to understand quantum transport measurements at low temperatures.