论文标题

信息理论点对称性分类/量子对具有强大转换假性对称的晶体的电子衍射点模式

Information-theoretic point symmetry classifications/quantifications of an electron diffraction spot pattern from a crystal with strong translational pseudosymmetry

论文作者

Moeck, Peter, von Koch, Lukas

论文摘要

最近开发的信息理论方法是通过数字传输电子和扫描探针显微镜图像在两个维度(2D)中进行晶体学对称分类和定量的方法,以分析实验性选择的区域透射电子衍射点模式。该晶体的提取的晶格参数在实验误差栏内,与指标张量相一致,该度量张量表明存在六边形翻译对称性。但是,低,中和高分辨率斑点合并的点对称性不高于2mm。该电子衍射模式属于矩形中心晶体而不是六边形晶体的可能性是根据其信息理论点组对称分类来量化的。可能是由于与精确的[001]区域轴相结合的略有不良对象,与埃瓦尔德球体的曲率结合在一起,以及一个真实结构,其中包括四倍体NBO的增长和三重大小和方向的三重横幅块,最高分辨率的斑点,即0.125至0.125至0.085至0.125至0.085 nm之间。仅有的。为比较提供了与实验获得的原始晶格参数兼容的传统分类的晶体学RSYM值。由于这是基于衍射的晶体学中的常见实践,因此,为低,中和高分辨率的斑点分别提供了最高分辨率斑点的点对称分类和最高分辨率斑点的定量结果。

The recently developed information-theoretic approach to crystallographic symmetry classifications and quantifications in two dimensions (2D) from digital transmission electron and scanning probe microscope images is adapted for the analysis of an experimental selected-area transmission electron diffraction spot pattern. The extracted lattice parameters of this crystal are within experimental error bars consistent with a metric tensor that suggests the presence of hexagonal translation symmetry. The point symmetry of the combined low, medium, and high resolution spots is, however, no higher than 2mm. The likelihood of this electron diffraction pattern belonging to a rectangular-centered crystal rather than a hexagonal crystal is quantified on the basis of its information-theoretic point group symmetry classifications. Presumably due to a slight misorientation away from the exact [001] zone axis combined with the curvature of the Ewald sphere and a real structure that includes intergrowth of quadruple NbO and triple BaNbO3 blocks of varying sizes and orientations, the group of highest resolution spots, i.e. d-spacings between 0.125 to 0.085 nm, feature point symmetry .m. only. The crystallographic Rsym values of traditional classifications into the point groups that are compatible with the experimentally obtained primitive lattice parameters are provided for comparison purposes. As it is common practice in diffraction based crystallography, point symmetry classification and quantification results for the group of highest resolution spots are provided separately from their counterparts for the combined low, medium, and high resolution spots.

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