论文标题
具有扩展缺陷的结构的统计理论
Statistical theory of structures with extended defects
论文作者
论文摘要
许多材料包含纳米尺度的扩展缺陷，例如位错，裂缝，孔，多态性包裹体和其他竞争阶段的胚胎。当一个人对这种缺陷的样本的精确内部结构不感兴趣，而是对整个整体属性感兴趣时，就需要统计图片给出统计图片，从而给出空间平均的描述。在本章中，提出了一种方法，以对具有扩展纳米化缺陷的材料进行统计描述。开发了一种方法，允许将问题减少到代表以有效重新归一化的汉密尔顿人为特征的一组系统复制品。这是通过定义在异物相结构上平均的过程来实现的。该方法由具有随机分布的无序区域的晶格模型说明。
Many materials contain extended defects of nanosize scale, such as dislocations, cracks, pores, polymorphic inclusions, and other embryos of competing phases. When one is interested not in the precise internal structure of a sample with such defects, but in its overall properties as a whole, one needs a statistical picture giving a spatially averaged description. In this chapter, an approach is presented for a statistical description of materials with extended nanosize defects. A method is developed allowing for the reduction of the problem to the consideration of a set of system replicas representing homogeneous materials characterized by effective renormalized Hamiltonians. This is achieved by defining a procedure of averaging over heterophase configurations. The method is illustrated by a lattice model with randomly distributed regions of disorder.
