论文标题

比较Simons天文台过渡边缘传感器的复杂阻抗和偏置步骤测量

Comparing complex impedance and bias step measurements of Simons Observatory transition edge sensors

论文作者

Cothard, Nicholas F., Ali, Aamir M., Austermann, Jason E., Choi, Steve K., Crowley, Kevin T., Dober, Bradley J., Duell, Cody J., Duff, Shannon M., Gallardo, Patricio, Hilton, Gene C., Ho, Shuay-Pwu Patty, Hubmayr, Johannes, Link, Michael J., Niemack, Michael D., Sonka, Rita F., Staggs, Suzanne T., Vavagiakis, Eve M., Wollack, Edward J., Xu, Zhilei

论文摘要

Simons天文台(SO)将对宇宙微波背景(CMB)进行基于地面的观测,并用几个小的光圈望远镜进行,每个望远镜都配备了数千至成千上万的超导铝锰(ALMN)过渡边缘传感器(Tess)。 TES竞争的原位表征和有效的时间常数将需要在每次观察日进行多次,以在CMB映射过程中校准时间流。在田间估计有效的时间常数通过在TES DC偏置的顶部短暂施加小振幅方波,并在验仪响应中拟合指数衰减。这些所谓的“偏差步骤”测量可以在整个阵列中迅速实施,因此很有吸引力,因为它们几乎没有观察时间。但是,单个探测器复杂的阻抗测量值虽然在观察过程中实施太慢,但可以提供更全面的TES模型,并更好地理解其时间响应。在这里,我们介绍了许多原型的深色TES表征的结果,因此凸电计,并比较通过偏置步骤测量的有效热时间常数与复杂阻抗数据得出的步骤。

The Simons Observatory (SO) will perform ground-based observations of the cosmic microwave background (CMB) with several small and large aperture telescopes, each outfitted with thousands to tens of thousands of superconducting aluminum manganese (AlMn) transition-edge sensor bolometers (TESs). In-situ characterization of TES responsivities and effective time constants will be required multiple times each observing-day for calibrating time-streams during CMB map-making. Effective time constants are typically estimated in the field by briefly applying small amplitude square-waves on top of the TES DC biases, and fitting exponential decays in the bolometer response. These so-called "bias step" measurements can be rapidly implemented across entire arrays and therefore are attractive because they take up little observing time. However, individual detector complex impedance measurements, while too slow to implement during observations, can provide a fuller picture of the TES model and a better understanding of its temporal response. Here, we present the results of dark TES characterization of many prototype SO bolometers and compare the effective thermal time constants measured via bias steps to those derived from complex impedance data.

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