论文标题

硅植入多晶钻石膜的光学特性

Optical properties of silicon-implanted polycrystalline diamond membranes

论文作者

Kambalathmana, H., Flatae, A. M., Hunold, L., Sledz, F., Müller, J., Hepp, M., Schmuki, P., Killian, M. S., Lagomarsino, S., Gelli, N., Sciortino, S., Giuntini, L., Wörner, E., Wild, C., Butz, B., Agio, M.

论文摘要

我们研究了含有硅胶囊(SIV)颜色中心的多晶钻石膜的光学特性,并结合其他纳米分析技术。我们分析了拉曼信号,SIV发射和晶粒晶界中的背景发光之间的相关性,从而确定了单SIV中心可寻址性的条件。此外,我们执行扫描透射电子显微镜(STEM)分析,该分析将膜的显微镜结构与钻石晶体沿生长方向的演变与光致发光特性以及飞行飞行时间的二级离子质谱法(TOF-SIMS)相关联,以解决硅胶中的分布和无元素的分布。茎和TOF-SIMS研究的结果与光学测量结果的结果一致,并为量子纳米镜的多晶样品的制备提供了有用的见解。

We investigate the optical properties of polycrystalline diamond membranes containing silicon-vacancy (SiV) color centers in combination with other nano-analytical techniques. We analyze the correlation between the Raman signal, the SiV emission, and the background luminescence in the crystalline grains and in the grain boundaries, identifying conditions for the addressability of single SiV centers. Moreover, we perform a scanning transmission electron microscopy (STEM) analysis, which associates the microscopic structure of the membranes and the evolution of the diamond crystal along the growth direction with the photoluminescence properties, as well as a time-of-flight secondary ion mass spectrometry (ToF-SIMS) to address the distribution of silicon in implanted and un-implanted membranes. The results of the STEM and ToF-SIMS studies are consistent with the outcome of the optical measurements and provide useful insight into the preparation of polycrystalline samples for quantum nano-optics.

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