论文标题

分子束积液细胞质量对量子点和量子井的光学和电性能的影响

Influence of molecular beam effusion cell quality on optical and electrical properties of quantum dots and quantum wells

论文作者

Nguyen, G. N., Korsch, A. R., Schmidt, M., Ebler, C., Labud, P. A., Schott, R., Lochner, P., Brinks, F., Wieck, A. D., Ludwig, A.

论文摘要

最近,使用高纯度材料,具有出色低噪声特性的量子点异质结构成为可能。我们提出了一项有关分子束外延种植的量子孔和量子点的研究,并具有污染的铝蒸发细胞,该细胞引入了大量的杂质,在光学和电气测量中可感知的异常。我们描述了一种解决此问题的方法,并发现通过过热来重新调节铝细胞可以使光致发光和电容 - 电压测量的异常恢复,从而导致出色的低噪声异质结构。此外,我们提出了一种使用电容 - 电压光谱在自组装量子点上感知光诱导的陷阱电荷的方法。缺陷中心的激发能量依赖性电离导致电容 - 电压光谱的变化,该光谱可用于确定通过1D带结构模拟的光诱导陷阱电荷的电荷密度。该方法可以在常用的量子点二极管结构上执行。

Quantum dot heterostructures with excellent low-noise properties became possible with high purity materials recently. We present a study on molecular beam epitaxy grown quantum wells and quantum dots with a contaminated aluminum evaporation cell, which introduced a high amount of impurities, perceivable in anomalies in optical and electrical measurements. We describe a way of addressing this problem and find that reconditioning the aluminum cell by overheating can lead to a full recovery of the anomalies in photoluminescence and capacitance-voltage measurements, leading to excellent low noise heterostructures. Furthermore, we propose a method to sense photo-induced trap charges using capacitance-voltage spectroscopy on self-assembled quantum dots. Excitation energy-dependent ionization of defect centers leads to shifts in capacitance-voltage spectra which can be used to determine the charge density of photo-induced trap charges via 1D band structure simulations. This method can be performed on frequently used quantum dot diode structures.

扫码加入交流群

加入微信交流群

微信交流群二维码

扫码加入学术交流群,获取更多资源