论文标题

X射线带中的无伪影编码的孔径成像具有多种不同的随机模式

Artifact-less Coded Aperture Imaging in the X-ray Band with Multiple Different Random Patterns

论文作者

Kasuga, Tomoaki, Odaka, Hirokazu, Hatauchi, Kosuke, Takashima, Satoshi, Tamba, Tsubasa, Aizawa, Yuki, Hashiba, Soichiro, Bamba, Aya, Zhou, Yuanhui, Tamagawa, Toru

论文摘要

编码的孔径成像技术是观察天体物理学中X射线成像的有用方法。但是,在解码图像中存在成像噪声或所谓的伪影是该方法的缺点。我们使用多种不同的随机模式提出了一种新的编码光圈成像方法,以显着降低图像伪影。该孔掩模包含多种不同的模式,每个模式都会在其解码图像中产生不同的伪影分布。通过求和所有不同模式的解码图像,可以取消伪影分布,我们获得了非常准确的图像。我们使用CMOS图像传感器和孔径掩模的组合,通过同步子光子弹簧-8的单色16 keV硬X射线光束进行成像实验来证明这一概念,该膜的组合具有四个不同的随机模式,该模式由径直径为27 UM和39 UM分离的孔组成。整个成像系统以25厘米长的紧凑型安装,并达到<30''的角度分辨率(最大宽度为一半)。此外,我们通过蒙特卡洛模拟显示,如果不同模式的数量增加到8或16,则可以更有效地减少伪影。

The coded aperture imaging technique is a useful method of X-ray imaging in observational astrophysics. However, the presence of imaging noise or so-called artifacts in a decoded image is a drawback of this method. We propose a new coded aperture imaging method using multiple different random patterns for significantly reducing the image artifacts. This aperture mask contains multiple different patterns each of which generates a different artifact distribution in its decoded image. By summing all decoded images of the different patterns, the artifact distributions are cancelled out, and we obtain a remarkably accurate image. We demonstrate this concept with imaging experiments of a monochromatic 16 keV hard X-ray beam at the synchrotron photon facility SPring-8, using the combination of a CMOS image sensor and an aperture mask that has four different random patterns composed of holes with a diameter of 27 um and a separation of 39 um. The entire imaging system is installed in a 25 cm-long compact size, and achieves an angular resolution of < 30'' (full width at half maximum). In addition, we show by Monte Carlo simulation that the artifacts can be reduced more effectively if the number of different patterns increases to 8 or 16.

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