论文标题
研究三重宝石检测器中充电效果的研究
Study of charging up effect in a triple GEM detector
论文作者
论文摘要
微型模式气态检测器技术的进步为我们提供了具有良好空间分辨率和高速率能力的不同类型的探测器，而气体电子乘数（GEM）探测器是其中之一。通常，宝石由薄的聚酰亚胺箔组成，厚度为50微米，顶部和底部的5微米铜覆层。聚酰亚胺的存在在外部辐射的影响下改变了检测器的增益，现象称为充电效应。通过AR/CO $ _2 $ _2 $的气体混合物以70/30的比例通过双掩膜三重GEM检测器原型研究了充电效果，并在连续照射下从强fe $^{55} $ x射线源中进行了连续照射。本文介绍了详细的测量方法和测试结果。
The advancement of Micro Pattern Gaseous Detector technology offers us different kinds of detectors with good spatial resolution and high rate capability and the Gas Electron Multiplier (GEM) detector is one of them. Typically GEM is made up of a thin polyimide foil having a thickness of 50 micrometers with 5 micrometers copper cladding on top and bottom sides. The presence of polyimide changes the gain of the detector under the influence of external radiation and the phenomenon is referred to as the charging up effect. The charging up effect is investigated with a double mask triple GEM detector prototype with Ar/CO$_2$ gas mixture in 70/30 ratio under continuous irradiation from a strong Fe$^{55}$ X-ray source. The detailed method of measurements and the test results are presented in this article.
