论文标题
多层半迪拉克黑磷的异常光热效应
Anomalous photo-thermal effects in multi-layered semi-Dirac black phosphorus
论文作者
论文摘要
多层钾的掺杂黑磷的光启动,该磷掺杂,该磷含量是张开的半dirac二维正常绝缘子(NI),将其转化为倒流对称性破碎的Chern绝缘子(CI)。从NI到CI的这种过渡发生在对应于周期性扰动的Floquet理论的高频辐射下,这是撞击光束。这种光诱导的拓扑CI相表现为有限的浆果曲率,并在存在纵向温度梯度的情况下形成了异常的横向热流。在这项工作中,对Ettinghausen(EE)和Righi-LeDuc效应(RLE)(RLE)的异常变体进行了定量分析。异常EE和RLE系数的强度是占用带上浆果曲率总和的直接结果,并且显示出随着费米水平在传导状态或价值深处的高度位置而显示的。下降归因于传导和价带中浆果曲率的翻转迹象。另外,当费米水平位于带隙中时,传导和价带的贡献可能会在数值上互相胜过彼此,而系数的值更大。最后,我们指出了如何超越浆果曲率的作用,可以利用几种实验室可访问方法来调节EE和RLE系数,包括菌株的应用,掺杂剂浓度的变化以及入射辐射的频率。
The photo-excitation of multi-layered potassium doped black phosphorus that exists as a gapped semi-Dirac two-dimensional normal insulator (NI), transforms it into a time-reversal symmetry broken Chern insulator (CI). This transition from an NI to CI happens under a high-frequency radiation corresponding to the off-resonant regime of the Floquet theory of periodic perturbations, which here is the impinging light beam. This photo-induced topological CI phase manifests as a finite Berry curvature and forms the basis of anomalous transverse heat flow in presence of a longitudinal temperature gradient. The anomalous variants of the Ettinghausen (EE) and Righi-Leduc effects (RLE), via their respective coefficients are quantitatively analyzed in this work. The strength of anomalous EE and RLE coefficients is a direct outcome of the sum of Berry curvatures over the occupied bands and is shown to drop as the Fermi level is positioned high in the conduction states or deep in the valence region. The drop is attributed to the flipped sign of the Berry curvature in the conduction and valence bands. Additionally, when the Fermi level lies in the band gap, the contribution of the conduction and valence bands may numerically outweigh one another for a much larger value of the coefficients. Finally, we point out how beyond the role of Berry curvature, several laboratory accessible methods can be utilized to modulate the EE and RLE coefficients, including an application of strain, variations in the dopant concentration, and frequency of incident radiation.