论文标题
高保真同时检测被困的离子Qubit寄存器
High-Fidelity Simultaneous Detection of Trapped Ion Qubit Register
论文作者
论文摘要
量子状态检测是量子计算的重要组成部分。随着量子寄存器中的量子台数量的增加，有必要维持高忠诚度检测以准确测量多Quit状态。 Here we present experimental demonstration of high-fidelity detection of a multi-qubit trapped ion register with average single qubit detection error of 4.2(1.5) ppm and a 4-qubit state detection error of 17(2) ppm, limited by the decay lifetime of the qubit, using a novel single-photon-sensitive camera with fast data collection, excellent temporal and spatial resolution, and low instrumental crosstalk.
Qubit state detection is an important part of a quantum computation. As number of qubits in a quantum register increases, it is necessary to maintain high fidelity detection to accurately measure the multi-qubit state. Here we present experimental demonstration of high-fidelity detection of a multi-qubit trapped ion register with average single qubit detection error of 4.2(1.5) ppm and a 4-qubit state detection error of 17(2) ppm, limited by the decay lifetime of the qubit, using a novel single-photon-sensitive camera with fast data collection, excellent temporal and spatial resolution, and low instrumental crosstalk.
