论文标题
探索从Xenon电子直接检测中为子MEV增强的暗物质
Exploring for sub-MeV Boosted Dark Matter from Xenon Electron Direct Detection
论文作者
论文摘要
直接检测实验转向失去搜索由于后坐力阈值而寻找亚M-EV光候选者的敏感性。但是，这种轻质的暗物质颗粒可以通过能量宇宙射线加速，从而可以用现有探测器检测到它们。我们从Xenon100/1t实验中得出了增强的轻暗物质和电子的散射的约束。我们说明，横截面的能量依赖性在提高检测灵敏度以及直接检测和其他实验的互补性方面起着至关重要的作用。
Direct detection experiments turn to lose sensitivity of searching for a sub-MeV light dark matter candidate due to the threshold of recoil energy. However, such light dark matter particles can be accelerated by energetic cosmic-rays such that they can be detected with existing detectors. We derive the constraints on the scattering of a boosted light dark matter and electron from the XENON100/1T experiment. We illustrate that the energy dependence of the cross section plays a crucial role in improving both the detection sensitivity and also the complementarity of direct detection and other experiments.
