论文标题
一种新型的直接结构化光检查技术，用于污染物和缺陷检测
A novel direct structured-light inspection technique for contaminant and defect detection
论文作者
论文摘要
本文提出的直接结构光检查技术（DSIT）是一种新颖的方法，可以在两种类型的二元结构光照明下实现，以检测污染物和缺陷在镜面表面和透明物体上，在该物体中使用光反射系统，用于检测光传输系统，同时将光系统应用于横面系统，用于临近镜像。基于此技术，无需任何计算过程即可直接获得污染物和缺陷分布。进行相关的模拟和实验以证明DSIT的有效性。
The Direct Structured-Light Inspection Technique (DSIT) proposed in this paper is a novel method that can be implemented under two types of binary structured light illumination to detect contaminants and defects on specular surfaces and transparent objects, in which light reflection system is used to detect specular surfaces, while light transmission system is applied for transparent object inspection. Based on this technique, contaminant and defect distribution can be directly obtained without any calculation process. Relevant simulations and experiments are performed to prove the effectiveness of DSIT.
