论文标题
PTFE的VUV传播用于XENON的粒子探测器
VUV Transmission of PTFE for Xenon-based Particle Detectors
论文作者
论文摘要
液体氙（LXE）基于粒子和Astroparpicle物理学的罕见事件搜索的探测器，可针对高XENON闪烁光收集和探测器材料的低背景速率进行了优化。聚二氟乙烯（PTFE，Teflon）通常用于封装活性LXE体积，因为其对VUV LXE LXE闪烁光的高反射率具有178 nm的峰值发射。 PTFE产生的反射率，传播和背景信号数取决于PTFE检测器壁的厚度。在这项工作中，我们介绍了在LXE检测器的设计阶段经常考虑的各种厚度的PTFE的VUV传输测量值。 PTFE样品在先前用于LXE中的反射率测量的设备中测量，并在178 nm的波长下使用准直的光。 Measurements in vacuum as well as gaseous xenon are described by the Kubelka and Munk model, as well as by Beer-Lambert's law for samples of $\geq 0.7\,\mathrm{mm}$ thickness, yielding a transmission coefficient of $λ_\text{BL} = (0.89 \pm 0.05)\,\mathrm{mm}$.这些测量值优化了Xenonnt暗物质实验的PTFE壁厚，并选择为$ \ geq 3 \，\ mathrm {mm} $。
Liquid xenon (LXe) based detectors for rare event searches in particle and astroparticle physics are optimized for high xenon scintillation light collection and low background rate from detector materials. Polytetrafluoroethylene (PTFE, Teflon) is commonly used to encapsulate the active LXe volume due to its high reflectance for VUV LXe scintillation light with peak emission at 178 nm. Reflectance, transmission and number of background signals arising from PTFE depend on the thickness of the PTFE detector walls. In this work, we present VUV transmission measurements for PTFE of various thicknesses often considered in the design phase of LXe detectors. PTFE samples are measured in an apparatus previously used for reflectance measurements in LXe using collimated light at a wavelength of 178 nm. Measurements in vacuum as well as gaseous xenon are described by the Kubelka and Munk model, as well as by Beer-Lambert's law for samples of $\geq 0.7\,\mathrm{mm}$ thickness, yielding a transmission coefficient of $λ_\text{BL} = (0.89 \pm 0.05)\,\mathrm{mm}$. The PTFE wall thickness of the XENONnT dark matter experiment was optimized by these measurements and selected as $\geq 3\,\mathrm{mm}$.
