论文标题
高度无序材料中的高分辨率应变测量
High resolution strain measurements in highly disordered materials
论文作者
论文摘要
测量小变形或菌株的能力对于理解材料的许多方面很有用。在此，对斑点衍射峰进行了新的分析，其中分析了斑点的系统移位，从而可以推断出应变（或流动）模式。该斑点跟踪技术的应变模式的精度类似于X射线单晶测量值，但在无定形或高度无序的材料中。
The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, a new analysis of speckle diffraction peaks is presented in which the systematic shifts of the speckles are analyzed allowing for strain (or flow) patterns to be inferred. This speckle tracking technique measures strain patterns with a accuracy similar to x-ray single crystal measurements but in amorphous or highly disordered materials.
