论文标题
表征未来单个光学和红外光子检测器的TES功率噪声
Characterizing TES Power Noise for Future Single Optical-Phonon and Infrared-Photon Detectors
论文作者
论文摘要
在这封信中，我们介绍了$ 100〜μ \ Mathrm {M} \ Times 400〜μ \ Mathrm {M} \ Times 40〜 \ Mathrm {nm} $ TUNGSTEN（W）Transition-EDGE传感器（TES），其关键温度为40 mk。该设备的噪声当量功率（NEP）为$ 1.5 \ times 10^{ - 18} \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ \ sqrt {\ mathrm {\ mathrm {hz}} $，以2.6 $ kHz的范围为$ 2.6 $ kHz，指示DIRAC DERAC DELAC DELTA ENFERCE DEDRM ME $ 40 \ pm pm pm pm pm pm pm pm pm pm pm pm pm pm 5 40 \ pm pm 5〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜〜 （RMS）。该设备所展示的性能是开发$ \ Mathcal {o}（100）〜\ Mathrm {Mev} $阈值Athermal Phonon检测器的关键步骤。
In this letter, we present the performance of a $100~μ\mathrm{m}\times 400~μ\mathrm{m} \times 40~\mathrm{nm}$ tungsten (W) Transition-Edge Sensor (TES) with a critical temperature of 40 mK. This device has a measured noise equivalent power (NEP) of $1.5\times 10^{-18}\ \mathrm{W}/\sqrt{\mathrm{Hz}}$, in a bandwidth of $2.6$ kHz, indicating a resolution for Dirac delta energy depositions of $40\pm 5~\mathrm{meV}$ (rms). The performance demonstrated by this device is a critical step towards developing a $\mathcal{O}(100)~\mathrm{meV}$ threshold athermal phonon detectors for low-mass dark matter searches.
