论文标题
针对各种复杂性的PT薄膜样品讨论的硬X射线谐振磁反射率的高级数据分析程序
Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity
论文作者
论文摘要
X射线谐振磁反射率（XRMR）是确定各种薄膜的光学，结构和磁深度曲线的强大方法。在这里，我们研究了在PT L $ _3 $吸收边缘测量的不同复杂性的样品，以确定实验XRMR曲线分析的最佳程序，尤其是对于非平凡的双层和多层样品，其中包括不同键合的PT从图层到图层。软件工具remagx用于拟合这些数据，并基于高度适应性的层堆栈对磁磁深度曲线进行建模，该堆栈被修改为对真实多层系统的更精确且物理上一致的表示。各种拟合算法，迭代优化方法以及对不对称比特征以及$χ^2 $（拟合的良好）景观的详细分析来改善测量和仿真之间的一致性。我们提出了针对PT薄膜系统量身定制的逐步分析程序，以利用XRMR的出色磁灵敏度和深度分辨率。
X-ray resonant magnetic reflectivity (XRMR) is a powerful method to determine the optical, structural and magnetic depth profiles of a variety of thin films. Here, we investigate samples of different complexity all measured at the Pt L$_3$ absorption edge to determine the optimal procedure for the analysis of the experimental XRMR curves, especially for nontrivial bi- and multilayer samples that include differently bonded Pt from layer to layer. The software tool ReMagX is used to fit these data and model the magnetooptic depth profiles based on a highly adaptable layer stack which is modified to be a more precise and physically consistent representation of the real multilayer system. Various fitting algorithms, iterative optimization approaches and a detailed analysis of the asymmetry ratio features as well as $χ^2$ (goodness of fit) landscapes are utilized to improve the agreement between measurements and simulations. We present a step-by-step analysis procedure tailored to the Pt thin film systems to take advantage of the excellent magnetic sensitivity and depth resolution of XRMR.
