论文标题
被困的离子纠缠大门强大的量子频率错误
Trapped-Ion Entangling Gates Robust Against Qubit Frequency Errors
论文作者
论文摘要
纠缠操作是进行大规模量子信息处理的必要工具，但是随着量子数的增加，实验瑕疵可以防止当前方案达到足够的保真度。在这里，在数值上显示了如何同时使标准的陷阱纠缠门的多色调概括与单个Qubits的频率的噪声和错误设置相同。这放宽了诱捕场所需的同质性程度，使物理上更大的系统更加实用。
Entangling operations are a necessary tool for large-scale quantum information processing, but experimental imperfections can prevent current schemes from reaching sufficient fidelities as the number of qubits is increased. Here it is shown numerically how multi-toned generalizations of standard trapped-ion entangling gates can simultaneously be made robust against noise and mis-sets of the frequencies of the individual qubits. This relaxes the degree of homogeneity required in the trapping field, making physically larger systems more practical.
