论文标题
MOS $ _ {\ rm 2} $/ni $ _ {80} $ fe $ _ {20} $接口的直接测量界面dzyaloshinskii-moriya互动
Direct measurement of interfacial Dzyaloshinskii-Moriya interaction at the MoS$_{\rm 2}$/Ni$_{80}$Fe$_{20}$ interface
论文作者
论文摘要
我们在二维过渡金属二甲核酸酯（2D-TMD），MOS $ _ {\ rm 2} $ _ {80} $ _ {80} $ fe $ _ {20} $（py）上，使用了二维过渡金属二甲化合物（2D-TMD），MOS $ _ {\ rm 2} $ _ {20} $（py），直接报告了对二维过渡金属二甲化合物（2D-TMD）界面的直接测量。在MOS $ _ {\ rm 2} $/py/ta中测量自旋分散体中的明显不对称性，而在参考PY/TA系统中未检测到这样的不对称性。 DMI常数的线性缩放与PY厚度的倒数表明观察到的DMI的界面起源。我们进一步观察到DMI在三到四层MOS $ _ {\ rm 2} $/py系统（通过56 $ \％$）的增强，而2层MOS $ _ {\ rm 2} $/py，这是由Moo $ _ {\ rm 3} $ nos $ nos $ soos $ py fort the the Fort there fort三层cass y the Four the Four tof Four frow thef Four tof Four thef Four frof Forth Four frof Four frof Forth Four fortht Forth的三个loft fortht Four f的。结果开放了利用基于2D-TMD的异质结构的自旋轨道应用程序的可能性。
We report on a direct measurement of sizable interfacial Dzyaloshinskii-Moriya interaction (iDMI) at the interface of two-dimensional transition metal dichalcogenide (2D-TMD), MoS$_{\rm 2}$ and Ni$_{80}$Fe$_{20}$ (Py) using Brillouin light scattering spectroscopy. A clear asymmetry in spin-wave dispersion is measured in MoS$_{\rm 2}$/Py/Ta, while no such asymmetry is detected in the reference Py/Ta system. A linear scaling of the DMI constant with the inverse of Py thickness indicates the interfacial origin of the observed DMI. We further observe an enhancement of DMI constant in three to four layer MoS$_{\rm 2}$/Py system (by 56$\%$) as compared to 2 layer MoS$_{\rm 2}$/Py which is caused by a higher density of MoO$_{\rm 3}$ defect species in the case of three to four layer MoS$_{\rm 2}$. The results open possibilities of spin-orbitronic applications utilizing the 2D-TMD based heterostructures.
