论文标题
II型Weyl半法中的伪场效应：倾斜锥的新探针
Pseudo field effects in type II Weyl semimetals: new probes for over tilted cones
论文作者
论文摘要
我们研究伪磁场对具有过度倾斜的Weyl锥或II型锥体的Weyl半法的影响。我们比较了II型Weyl半学型中所得的伪landau水平与已知的I型锥体的现象学。我们预测，由于磁场，伪磁场或其组合导致的手性Landau水平的性质，可以利用光导率来检测II型相位并推断倾斜的方向。最后，我们讨论了通过已知的分层构建体的概括来设计均质和不均匀II型半学型的方法，以创建受控的伪磁场和过度倾斜的锥体。
We study the effects of pseudo-magnetic fields on Weyl semimetals with over-tilted Weyl cones, or type II cones. We compare the phenomenology of the resulting pseudo-Landau levels in the type II Weyl semimetal to the known case of type I cones. We predict that due to the nature of the chiral Landau level resulting from a magnetic field, a pseudo-magnetic field, or their combination, the optical conductivity can be utilized to detect a type II phase and deduce the direction of the tilt. Finally, we discuss ways to engineer homogeneous and inhomogeneous type II semimetals via generalizations of known layered constructions in order to create controlled pseudo-magnetic fields and over-tilted cones.
