论文标题
在高度瞬态EUV光子诱导的等离子体中映射电子动力学的附录:使用多模式微波腔谐振光谱的新型诊断方法''
Addendum to `Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy'
论文作者
论文摘要
在最近的出版物中引入了一种用于电离辐射的内线光束监测器的新方法(Beckers,J。,等。“在高度瞬态EUV光子光子诱导的等离子中映射电子动力学:一种使用多模式微波腔恢复量的新型诊断方法。由于最近发现和研究了对余辉的其他第三个衰减状态,该状态的极端紫外线光子诱导的血浆在后来的文章中描述了(Platier,B。等。在此阈值附近或之下,我们解释说诊断方法的响应时间是一个限制因素。此外,脉冲中光子数量的第二个限制与高能自由电子的捕获有关。
A new approach for an in-line beam monitor for ionizing radiation was introduced in a recent publication (Beckers, J., et al. "Mapping electron dynamics in highly transient EUV photon-induced plasmas: a novel diagnostic approach using multi-mode microwave cavity resonance spectroscopy." Journal of Physics D: Applied Physics 52.3 (2018): 034004.). Due to the recent detection and investigation of an additional third decay regime of the afterglow of an extreme ultraviolet photon-induced plasma described in a later article (Platier, B., et al. "Transition from ambipolar to free diffusion in an EUV-induced argon plasma." Applied Physics Letters 116.10 (2020).) there is an additional reason for a minimum number of photons for this approach to work. Near or below this threshold, we explain that the response time of the diagnostic method is a limiting factor. Further, a second limit for the number of photons within a pulse is formalized related to the trapping of highly energetic free electrons.