论文标题
电阻故障电流限制器中的电流密度分布及其对设备稳定性的影响
Current density distribution in resistive fault current limiters and its effect on device stability
论文作者
论文摘要
在这种限制器设计中，电阻型超导体故障电流限制器（R-SFCL）沿着电阻型超导体故障限制器（R-SFCL）的增加被认为是一个重要问题。 R-SFCL中电流的不均匀分布仅增加某些超导区域中的电流，因此，在断层条件下，仅超导体的某些部分经历了相变，从而增加了这些区域中的热压并导致设备的分解和破坏。在本文中，已经模拟和研究了R-SFCS构建体中使用的常见模式的当前密度分布。为此，与其他模式相比，R-SFCL提出了一个有效的模型，以实现超导体比超导体的最高均匀性。该模拟导致ANSYS MAXWELL软件主张提出的模型的适当且令人满意的性能。
The increase of current uniformity along of a resistive type superconductor fault current limiter (R-SFCL) in the design of this type of limiters is well perceived as an important issue. The non-uniform distribution of current in R-SFCL only increases the current in some superconducting regions, as a result, in the fault conditions, only certain parts of the superconductor undergo a phase change that increases the heat pressure in those areas and causes the breakdown and destruction of the device. In this paper, the current density distributions in common patterns used in R-SFCs constructions have been simulated and investigated. To this end, an effective model is proposed for R-SFCL to achieve the highest uniformity of current and harmonic phase change over superconductors compared to other patterns. The simulation results in the Ansys Maxwell Software advocate the appropriate and satisfying performance of the proposed model.
