论文标题
动态校正的交叉谐振门的模拟随机基准测试
Simulated Randomized Benchmarking of a Dynamically Corrected Cross-Resonance Gate
论文作者
论文摘要
从理论上讲，我们考虑了由Calderon-Vargas＆Kestner提出的脉冲序列实现的交叉谐振（CR）门。莱特牧师。 118，150502（2017）。这些序列减轻了系统误差的一阶，但是它们的有效性受到一分门缺陷的限制。使用其他微波控制脉冲，可以将有效的CR Hamiltonian调整为最佳运行的制度。这通过减少误差校正所需的一分操作来提高这些序列的总体可行性。我们通过模拟弱耦合传输系统的随机基准测试来说明这一点，并表明，尽管这种新颖的脉冲序列在Transmons中的当前最新水平并不具有优势，但它确实改善了Cr Gate不忠的标度，并具有一号电位的栅极不适性。
We theoretically consider a cross-resonance (CR) gate implemented by pulse sequences proposed by Calderon-Vargas & Kestner, Phys. Rev. Lett. 118, 150502 (2017). These sequences mitigate systematic error to first order, but their effectiveness is limited by one-qubit gate imperfections. Using additional microwave control pulses, it is possible to tune the effective CR Hamiltonian into a regime where these sequences operate optimally. This improves the overall feasibility of these sequences by reducing the one-qubit operations required for error correction. We illustrate this by simulating randomized benchmarking for a system of weakly coupled transmons and show that while this novel pulse sequence does not offer an advantage with the current state of the art in transmons, it does improve the scaling of CR gate infidelity with one-qubit gate infidelity.
