论文标题
DeepEpletion CCD中的撕裂和相关场畸变
Tearing and related field distortions in deep-depletion CCDs
论文作者
论文摘要
影响CCD中平坦场帧的撕裂模式是执行像素响应非均匀性校正的视觉障碍。这些模式可以用侧向场扭曲来解释，这是由传感器柱之间的通道停止中孔的不均匀分布引起的。在LSST摄像机开发过程中，已经提出了许多实用的修复程序来摆脱撕裂。但是，将这些修复程序应用于我们的16通道Teledyne-E2V传感器，最多可以在每个片段的垂直边缘处有失真模式。我们的工作假设是，撕裂的起源是平行时钟本身，它移动了在通道停止区域中存在的孔。这些转移的效率在很大程度上取决于时钟操作的细节，从而导致观察到的变形模式的种类。因此，可以通过执行清除操作来删除大多数失真模式，该操作使通道停止的孔分布在获取框架之前，该操作会使孔分布更平坦。一个更有效的解决方案是切换所有时钟操作以使用双极电压集。
Tearing patterns affecting flat field frames in CCDs are a visually striking obstacle to performing Pixel Response Non-Uniformity corrections. These patterns can be explained by lateral field distortions, caused by the non-uniform distribution of holes in the channel stops between sensor columns. Over the course of LSST camera development, a number of practical fixes have been suggested to get rid of tearing. But applying these fixes to our 16-channel Teledyne-e2v sensors leaves at best a distortion pattern at the vertical edges of every segment. Our working hypothesis is that the origin of the tearing is the parallel clocking itself, which moves the holes that are present in the channel stops regions. The efficiency of these transfers depends strongly on the details of the clocking operations, resulting in the observed variety of distortion patterns. Removal of most of the distortion patterns can therefore be achieved by executing a purge operation, which flattens back the hole distribution in the channel stops, immediately before acquiring a frame. A more effective solution is to switch all clocking operations to use a bipolar voltage set.
